– X-ray fine structure analysis
Phase and structural analysis with X-rays goes back to discovery of diffraction of X-rays by crystals by Max von Laue, Walter Friedrich and Paul Knipping published in 1912.
In the X-ray tubes in the X-ray diffractometers used today, anodes made of Cr, Cu or Mo, for example, are contained as the source of radiation. On account of the high applied acceleration voltages of 40 kV or more, suitable electrical insulation against the environment of the tubes is necessary. Against this background, the use of high-purity, dense-sintered Al2O3 ceramic is expedient as it brings the following advantages for this application:
- Purity: >99.5 %
- Density: >98 % of the theoretical value
- Dielectric strength of at least 20 kV per mm wall thickness
- No radiation-induced change in the material that would impair electrical insulation
- High resistance to high temperatures and thermal shock
- High mechanical strength
For decades, insulators made of this type of ceramic have been reliable and proven components in X-ray tubes in equipment and systems for structural analysis.